| Mfgr. |
Model |
Description |
Ref # |
| Advantest
|
T3324 |
VLSI Tester Parts Machine |
COM21 |
| Advantest
|
T3324 |
VLSI Tester Parts Machine |
COM263 |
| Advantest |
T5335P |
Memory Tester |
COM258 |
| Advantest |
T5335 |
Memory Tester -Parts Machine |
COM158 |
| Advantest |
T5335 |
Memory Tester |
COM283 |
| Advantest |
T3347 |
VLSI Tester Parts Machine |
COM249 |
| Advantest |
T5365P |
Memory Tester-Parts Machine |
COM198 |
| Advantest |
T5371 |
Memory Tester |
COM402 |
| Advantest |
T5381 |
Memory Tester |
COM252 |
| Advantest |
T5382A |
Memory Tester |
COM173 |
| Advantest |
T5581H |
Memory Tester |
COM332 |
| Advantest |
T6683 |
SOC Test System |
COM361 |
| Agilent / HP |
4062UX |
Parametric Tester Parts Machine |
COM216 |
| Agilent / HP |
4062UX |
Parametric Tester |
COM325 |
| Agilent / HP |
82000 |
D100 VLSI Tester 100 Mhz 96 pins |
COM2 |
| Agilent / HP |
82000 |
D200 VLSI Tester 200 Mhz up to 240 pins |
COM3 |
| Agilent / HP |
82000 |
D100 VLSI Tester 100 Mhz 176 pins |
COM19 |
| Agilent / HP |
82000 |
D100 w/APG option, 128 pins |
COM87 |
| Agilent / HP |
83000 |
VLSI Tester |
COM108 |
| Agilent / HP |
83000 |
E2811, 256 pins |
COM49 |
| Agilent / HP |
83000 F120T |
VLSI Tester 48 pins |
COM135 |
| Agilent / HP |
83000 F330T |
VLSI Tester 224 pins |
COM50 |
| Agilent / HP |
83000 660I |
VLSI Tester 96 Pins |
COM24 |
| Agilent / HP |
83000 F330T |
VLSI Tester 80 Mhz 400 pins |
COM13 |
| Agilent / HP |
83000 F330T |
VLSI Tester 120 Mhz 480 pins |
COM18 |
| Agilent / HP |
83000 F330T |
VLSI Tester 330 Mhz 224 Pins/1 Meg |
COM22 |
| Agilent / HP |
83000 F330T |
VLSI Tester 120 Mhz 336 pins 1 Meg |
COM43 |
| Agilent / HP |
83000 F330T |
VLSI Tester 120 Mhz 256 pins 4 Meg |
COM136 |
| Agilent / HP |
84000 A120T |
A120T RF Spares Tester |
COM335 |
| Agilent / HP |
94000 |
Spare Parts Machine |
COM243 |
| Agilent / Verigy |
93000
P1000 |
Mixed Signal Tester |
COM329 |
| Agilent / Verigy |
93000
C400e |
Mixed Signal Tester |
COM330 |
| Agilent / Verigy |
93000
C400e |
Mixed Signal Tester |
COM331 |
| Agilent / Verigy |
93000 P600 |
Mixed Signal Tester |
COM310 |
| Agilent / Verigy |
V4400/V4436 |
Memory Tester Parts Machine |
COM284 |
| Agilent / Verigy |
V4436 |
Memory Tester |
COM363 |
| Credenc e (TMT) |
ASL1000 |
In Test Manipulator |
COM401 |
| Credence |
ASL 3000RF |
RF Test System |
COM392 |
| Credence |
Duo |
Mixed Signal Tester |
COM69 |
| Credence |
Duo |
Mixed Signal Tester |
COM96 |
| Credence |
Cal
Station |
Credence Calibration Station for Credence
Quartet and Credence Duo's |
COM28 |
| Credence |
Duo XP |
Mixed Signal Tester |
COM120 |
| Credence |
Duo
XP |
Mixed Signal Tester |
COM121 |
| Credence |
Duo SX |
Mixed Signal Tester |
COM122 |
| Credence |
Duo SX |
Mixed Signal Tester |
COM123 |
| Credence |
LT1000 |
Mixed Signal Tester |
COM124 |
| Credence |
LT1001 |
Mixed Signal Tester |
COM125 |
| Credence |
Octet 200 |
Mixed Signal Tester |
COM342 |
| Credence
|
Quartet |
Mixed Signal Tester |
COM300 |
| Credence |
Quartet |
Mixed Signal Tester |
COM344 |
| Credence
|
Vista Vision |
Mixed Signal Tester |
COM35 |
| EPRO |
142AX |
EPROM Tester |
COM83 |
| ESI |
9350 |
Laser Repair Station |
COM372 |
| ESI |
9800 |
Laser Fuser |
COM237 |
| HILEVEL |
ETS300 |
Digital Test System |
COM15 |
| HILEVEL |
ETS300 |
Digital Test System |
COM16 |
| Jetlight
|
9290 |
EEPROM Chip Eraser |
COM193 |
| Megatest |
GII |
Memory Tester |
COM85 |
| Megatest |
GII |
Memory Tester |
COM86 |
| Mosaid |
MS4155 |
Memory Tester Parts Machine |
COM220 |
| Mosaid |
MS4155 |
Memory Tester |
COM272 |
| Mosaid |
MS4205EX |
Bench Tester |
COM357 |
| Mosaid |
MS3480 |
Memory Tester |
COM245 |
| Mosaid |
MS3495 |
Memory Tester |
COM146 |
| Mosaid |
MS4205EX |
Memory Tester |
COM375 |
| RVSI |
GS7100 |
GS-7100 Lead Scanner |
COM186 |
| RVSI |
LS7100 |
LS-7100 |
COM328 |
| RVSI |
LS7100 |
LS-7100 Lead Scanner |
COM73 |
| RVSI |
LS7700 |
LS-7700 Lead Scanner |
COM116 |
| RVSI |
LS7700 |
LS-7700 Lead Scanner |
COM322 |
| RVSI |
LS3900 |
LS-3900DB Lead Scanner |
COM119 |
| RVSI |
LS3700 |
LS-3700DB Lead Scanner |
COM128 |
| Sentry/ Fairchild/Schlumberger |
S21/S20 |
20 Mhz Digital Tester |
COM5 |
| Sentry/Fairchild/Schlumberger |
S10 |
10 Mhz Digital Tester |
COM6 |
| Sentry/Fairchild/Schlumberger |
Sentinel |
Digital Tester |
COM7 |
| Sentry/Fairchild/Schlumberger |
ITS 9000KX |
VLSI Logic Test System 664 pins |
COM88 |
| Sentry/Fairchild/Schlumberger |
ITS 9000KX |
VLSI Logic Test System 376 pins |
COM89 |
| Sentry/Fairchild/Schlumberger |
S1650 |
Digital IC Test System, System and Spares |
COM12 |
| Sentry/Fairchild/Schlumberger |
S790 |
Parts Machine |
COM303 |
| Teradyne |
Catalyst |
D200 Test System with 384
Pins |
COM259 |
| Teradyne |
Catalyst-RF |
Parts Machine |
COM366 |
| Teradyne |
A567 |
Mixed Signal Test System |
COM139 |
| Teradyne |
A575 |
Parts Machine |
COM207 |
| Teradyne |
A575 |
Parts Machine |
COM336 |
| Teradyne |
A585 |
Parts Machine |
COM184 |
| Teradyne |
J937 |
Memory Test System, 50 MHZ Mem Tester |
COM8 |
| Teradyne |
J937 |
Memory Test System, 100 MHZ |
COM9 |
| Teradyne |
J971SP |
Logic Test System |
COM410 |
| Teradyne |
J971 |
VLSI Logic Test System, 100 Mhz |
COM23 |
| Teradyne |
J993 |
Memory Test System |
COM40 |
| Teradyne |
J995 |
Memory Test System |
COM42 |
| Teradyne |
J997 |
Memory Test System |
COM26 |
| Teradyne |
Tiger |
System & Spares |
COM395 |
| Versatest |
VT2104 |
Memory Tester |
COM400 |
