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| New Arrivals | ||
| Model | Description | Ref # | |
| Advantest 5365 | COM53 | ||
| Agilent 4062 UX | HP 4062 Parametric Tester | COM63 | |
| Agilent 4062 UX | HP 4062 Parametric Tester | .03 | |
| Agilent 4062 UX | HP 4062 Parametric Tester | COM65 | |
| Agilent V1208 | Tester | COM66 | |
| Agilent V3301 | Tester | COM67 | |
| Disco DFD 2S/8 | Dicing Saw |
ICA9 |
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| EG 2001X | 6 inch Automatic Wafer Prober | PRO7 | |
| EG 2001 | 6 inch Automatic Wafer Prober |
PRO33 |
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| EG 2010 | Automatic Wafer Prober |
PRO37 |
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| EG 2080 | Automatic Wafer Prober | PRO32 | |
| EG 3001 | Automatic Wafer Prober | PRO40 | |
| EG 4090 | 8 inch Automatic Wafer Prober |
PRO24 |
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| EG 4085 | 8 inch Automatic Wafer Prober |
PRO 29 |
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| EG 4085 | 8 inch Automatic Wafer Prober |
PRO39 |
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| Espec/Tabai WBD-02CU | Wafer Burn in System | COM51 | |
| HP 83000 F330T | VLSI Tester 120 Mhz 336 pins 1 Meg | COM43 | |
| JEM | Wafer Needle Dresser |
PRO36 |
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| K&S 1471 | Bonder | ICA7 | |
| K&S 1488 | Bonder | ICA6 | |
| LTX Synchromaster | Mixed Signal IC Test System | COM39 | |
| LTX TS80 | Component Tester | COM58 | |
| LTX DX90 | Component Tester | COM59 | |
| LTX 88 | Component Tester | COM60 | |
| LTX CP100 | Component Tester | COM61 | |
| Mactronix Eureka IV | Wafer Transfer | PRO35 | |
| Mutlitest 9320 | HAN36 | ||
| RapidTran II | Wafer Transfer | PRO34 | |
| Rucker and Kolls 681A | Semi-Automatic Wafer Prober | PRO4 | |
| Schlumberger E Beam Prober | IDS 10000 Plus | PRO38 | |
| STS 6120 | COM68 | ||
| Tel P8 | Automatic Wafer Prober | PRO18 | |
| Tel Mark8 | Coater / Developer |
FAB27 |
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